Attending IEEE NSS/MIC 2016

July 07, 2016

PTI will be attending the IEEE Nuclear Science Symposium/Medical Imaging Conference October 29 through November 6 in Strasbourg, France this fall. We have been selected for one presentation, entitled Neutron Imaging Detector Based on Multiple Layers of Boron-Coated Straws, as well as several posters. We hope to see you there!